Noyes AFL M210 Micro OTDR SM 1310nm 1550nm With VFL

Introducing the GE Inspection Phasor XS 16:64 Phased Array Flaw Detector, a durable and compact equipment designed for non-destructive testing (NDT) applications. Combining the strengths of phased array technology and a traditional ultrasonic flaw detector, this device revolutionizes the inspection process.

1. Advanced Phased Array Technology: The Phasor XS utilizes phased array technology, allowing the operator to control multiple beams simultaneously using a single probe. This precise beam manipulation enhances the detection and measurement of defects, providing improved accuracy.
2. Comprehensive Display and Data: With its 6.5-inch VGA color TFT screen boasting a resolution of 640×480 pixels and a refresh rate of 60Hz, the Phased Array Flaw Detector offers a full-color sector display. 
3. Versatile Channel Configuration: The device features one standard channel and can accommodate 1 to 128 phased array channels. 

4. Enhanced Efficiency and Productivity: By incorporating phased array technology, the Phasor XS significantly improves inspection efficiency and reduces expenses compared to traditional ultrasonic techniques.

Experience the durability, versatility, and efficiency of the GE Inspection Phasor XS 16:64 Phased Array Flaw Detector. Invest in this cutting-edge equipment to elevate your non-destructive testing capabilities and enhance defect detection and measurement accuracy.

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NOTE: GE Equipment is not associated or affiliated with nor are we an authorized distributor or representative of Rockwell Automation or any other manufacturer, brand, or product listed.

 Noyes AFL M210 Micro OTDR SM 1310nm 1550nm With VFL